Site Map Guestbook News Support Download / Purchase Efficiency Testlab About

TestLab References
Efficiency TestLab
TestLab Background
Refractive Indices
Measurements
Groove Profile Measurements
Roughness/Interdiffusion Measurements
Efficiency/Scattered Light Measurements
Calculations
Certificates
TestLab Screenshots
TestLab References
Reference 21 E.L. Church, P.Z. Takacs, SPIE 1009 (1988) 46.
Reference 22 J.S. Vallarubia, JR of the NIST 102 (1997) 425.
Reference 23 J. Bennett, L. Mattson, Introduction to Surface Roughness and Scattering, 2nd ed., OSA, Washington, D.C., 1999.
Reference 24 J.V. Bixler, C.J. Hailey, C.W. Mauche, P.F. Teague, R.S. Thoe, S.M. Kahn, F.B.S. Paerels, SPIE 1549 (1991) 420.
Reference 25 T. Hessler, M. Rossi, R.E. Hunz, M.T. Gale, AO 37 (19) (1998) 4069.
Reference 26 K. Osterried, K.F. Heidermann, B. Nelles, AO 37 (34) (1998) 8002.
Reference 27 P. Mouroulis, D.W. Wilson, P.D. Maker, and R.E. Muller, AO 37 (31) (1998) 7200.
Reference 28 P. Laakkonen, M. Kuitten, J. Simonen, J. Turunen, AO 39 (19) (2000).
Reference 29 M.P. Kowalski, J.F. Seely, L.I. Goray, W.R. Hunter, J.C. Rife, AO 36 (34) (1997) 8939.
Reference 30 J.F. Seely, M.P. Kowalski, R.G. Cruddace, K.F. Heidemann, U. Heinzmann, U. Kleineberg, K. Osterried, D. Menke, J.C. Rife, W.R. Hunter, AO 36 (31) (1997) 8206.
Reference 31 M.P. Kowalski, T.W. Barbee, K.F. Heidermann, H. Gursky, J.C. Rife, W.R. Hunter, G.G. Fritz, R.G. Cruddace, AO 38 (31) (1999) 6487.
Reference 32 E.G. Loewen, E. Popov, Diffraction Gratings and Applications, Marcel Dekker, New York, 1997.
Reference 33 M.C. Hutley, Diffraction Gratings, Academic Press, London, 1982.
Reference 34 C.J. Raymond, M.R. Murnane, S. Sohail, H. Naqvi, J.R. McNeil, JVST B 13 (4) (1995) 1484.
Reference 35 C.J. Raymond, M.R. Murnane, S.L. Prins, S. Sohail, H. Naqvi, J.R. McNeil, J.W. Hosch, JVST B 15 (2) (1997) 361.
Reference 36 C.J. Raymond, S. Sohail, H. Naqvi, J.R. McNeil, SPIE 3050 476 (1997).
Reference 37 C. Palmer, ed., Diffraction Gratings Handbook, 6th ed., Newport Corp. Press, Rochester, 2005.
Reference 38 I.G. Kuznetsov, D.A. Content, R.A. Boucarut, T.J. Madison, SPIE 4485 (2001) 417.
Reference 39 J.F. Seely, NRL extreme ultraviolet and soft X-ray calibration facility at the National Synchrotron Light Source, SSD NRL, Washington DC, 2004.
Reference 40 J.C. Rife, H.R. Sadeghi, W.R. Hunter, RSI 60 (7) (1989) 2064.

PreviousNext
Site Map Contacts
Copyright © 1996-2010 International Intellectual Group, Inc.
About Efficiency TestLab Download / Purchase Support News
All rights reserved.